Due to its ability to precisely measure the x, y, and z directions with nanoscale resolution, atomic force microscopy is one of the most widely used methods for metrology measures such as surface roughness.

Surface roughness measurements using atomic force microscopy can be done in a variety of ways, depending on the type of contact. Contact mode, in which the tip is “dragged” across the surface at a constant cantilever deflection, is the simplest mode. To choose a heavier load for rigid, tough materials and a smaller load for softer materials, the user specifies the load at which the tip is “dragged” across the surface. The cantilever deflection is then maintained throughout the image by a feedback loop on the instrument’s z piezo. The z piezo motion transmits topographic information.

NextGen’s NG-SR400T Surface Roughness Tester has the following sensor force: Measuring force<4mN, Skid force<400mN.

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