With stylus profilometers, which typically record profiles with lengths of several millimetres, methods for broad surface texture evaluation are provided in this framework of ISO standards. Of course, the mathematics also apply to profiles captured by other techniques and to profiles of any length. It is crucial to detail exactly how the analysis was set up in any reporting when applying the ISO 4287 standard in a “nonstandard” manner.

The length in the X direction utilized to identify the abnormalities defining the profile under review is referred to as the sampling length in the ISO 4287 standard. Or, to put it another way, it is the distance necessary to be able to incorporate enough minor deviations for a pertinent evaluation without including irrelevant long-wavelength components. In fact, the Primary Profile, the Waviness Profile, and the Roughness Profile all have different sampling lengths as per the ISO 4287 standard. Most parameters are averaged over the number of Sampling Lengths after being determined for one Sampling Length at a time (number of cut-offs).

NextGen’s NG-SR400-T System Roughness Tester complies with ISO 4287 standard.

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